Analytical method using modified scanning probes
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1998-06-09
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Abstract
The present invention provides a method of analyzing for a specific material in a sample using a sensor including a resonating member having resonating properties. The resonating member has a probe and a known material is disposed on or forms the probe. The method includes the steps of positioning the sensor proximate to the sample, detecting a force dependent change in the resonance properties of the sensor, and confirming the presence of the specific material based on the identity of the known material and the detection of a resonance change.
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article