A Novel Technique for Microwave Thickness Measurement of Dielectric Slabs Using an Open-Ended Rectangular Waveguide
Date
1992
Authors
Bahktiari, S.
Ganchev, S.
Zoughi, R.
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Abstract
Media consisting of a dielectric slab backed by a conducting plate are used in many facets of industry. Monitoring the thickness or permittivity uniformity of such slabs is of great importance. Ability of microwaves to penetrate inside dielectrics and its sensitivity to material inhomogeneities makes them suitable for this type measurements [1,2].
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Wed Jan 01 00:00:00 UTC 1992