Characterization of Piezoelectrics Using Line-Focus Transducer

dc.contributor.author Yang, Che-Hua
dc.date 2018-02-14T08:06:57.000
dc.date.accessioned 2020-06-30T06:49:18Z
dc.date.available 2020-06-30T06:49:18Z
dc.date.copyright Thu Jan 01 00:00:00 UTC 1998
dc.date.issued 1998
dc.description.abstract <p>Besides providing comparable resolution as light microscope, acoustic microscope (AM) has its unique application in the area material characterization. Material characterization using AM is based on the measurement of leaky surface wave speed, which is extracted from the so-called V(z) curve[1]. In this V(z) technique, usually a tonebust mode of operation is required and relatively higher equipment cost is needed.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1998/allcontent/22/
dc.identifier.articleid 3614
dc.identifier.contextkey 5810408
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1998/allcontent/22
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/61384
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1998/allcontent/22/1998_Yang_CharacterizationPiezoelectrics.pdf|||Fri Jan 14 22:40:06 UTC 2022
dc.source.uri 10.1007/978-1-4615-5339-7_22
dc.subject.disciplines Acoustics, Dynamics, and Controls
dc.title Characterization of Piezoelectrics Using Line-Focus Transducer
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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