A Real-Time Phase Unwrapping Algorithm For EPSI Material Deformation Measurements

dc.contributor.author Blackshire, J.
dc.contributor.author Hardie, R.
dc.contributor.author Younus, M.
dc.date 2018-02-14T08:55:04.000
dc.date.accessioned 2020-06-30T06:52:21Z
dc.date.available 2020-06-30T06:52:21Z
dc.date.copyright Fri Jan 01 00:00:00 UTC 1999
dc.date.issued 1999
dc.description.abstract <p>Electronic Phase-Stepped Interferometry (EPSI) is a laser-based NDE technique capable of providing out-of-plane displacement and surface topography measurements on the order of a nanometer [1]. The technique has the potential for providing real-time measurement capabilities provided data capture and data reduction rates could be minimized. This in turn could provide an opportunity for studying and characterizing surface defect information in advanced materials such as Ti-6A1-4V and A120204-T3 using time-sequenced studies and methods. The possibility of characterizing defect precursor information may then become possible through time-evolution history studies.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1999/allcontent/97/
dc.identifier.articleid 3960
dc.identifier.contextkey 5820202
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1999/allcontent/97
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/61820
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.uri 10.1007/978-1-4615-4791-4_97
dc.title A Real-Time Phase Unwrapping Algorithm For EPSI Material Deformation Measurements
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3