A New Electromagnetic Instrument for Thickness Gauging of Conductive Materials

dc.contributor.author Fulton, J.
dc.contributor.author Wincheski, Buzz
dc.contributor.author Nath, S.
dc.contributor.author Reilly, J.
dc.contributor.author Namkung, Min
dc.date 2018-02-14T06:10:30.000
dc.date.accessioned 2020-06-30T06:43:35Z
dc.date.available 2020-06-30T06:43:35Z
dc.date.copyright Sun Jan 01 00:00:00 UTC 1995
dc.date.issued 1995
dc.description.abstract <p>Eddy current techniques are widely used to measure the thickness of electrically conducting materials[1–3]. The approach, however, requires an extensive set of calibration standards and can be quite time consuming to set up and perform. Recently, an electromagnetic sensor was developed which eliminates the need for impedance measurements [4–8]. The ability to monitor the magnitude of a voltage output independent of the phase enables the use of extremely simple instrumentation. Using this new sensor a portable hand-held instrument was developed (Fig. 1). The device makes single point measurements of the thickness of nonferromagnetic conductive materials. The technique utilized by this instrument requires calibration with two samples of known thicknesses that are representative of the upper and lower thickness values to be measured. The accuracy of the instrument depends upon the calibration range, with a larger range giving a larger error. The measured thicknesses are typically within 2–3% of the calibration range (the difference between the thin and thick sample) of their actual values. In this paper the design, operational and performance characteristics of the instrument along with a detailed description of the thickness gauging algorithm used in the device are presented.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1995/allcontent/295/
dc.identifier.articleid 2656
dc.identifier.contextkey 5800245
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1995/allcontent/295
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/60565
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1995/allcontent/295/1995_Fulton_NewElectromagnetic.pdf|||Fri Jan 14 23:15:05 UTC 2022
dc.source.uri 10.1007/978-1-4615-1987-4_295
dc.title A New Electromagnetic Instrument for Thickness Gauging of Conductive Materials
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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