Managing the Impact of On-chip Temperature on the Lifetime Reliability of Reliably Overclocked Systems

dc.contributor.author Subramanian, Viswanathan
dc.contributor.author Ramesh, Prem Kumar
dc.contributor.author Somani, Arun
dc.contributor.department Department of Electrical and Computer Engineering
dc.date 2021-02-17T02:32:41.000
dc.date.accessioned 2021-02-25T17:08:25Z
dc.date.available 2021-02-25T17:08:25Z
dc.date.copyright Thu Jan 01 00:00:00 UTC 2009
dc.date.embargo 2008-01-01
dc.date.issued 2009-01-01
dc.description.abstract <p>Physical and environmental variations require the addition of safety margins to the clock frequency of digital systems, making it overly conservative. Aggressive, but reliable, dynamic clock frequency tuning mechanisms that achieve higher system performance, by adapting the clock rates beyond worst case limits, have been proposed earlier. Even though reliable over-clocking guarantees functional correctness, it leads to higher power consumption and overheating. As a consequence, reliable over-clocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this paper, we analyze how reliable over-clocking impacts the on-chip temperature of microprocessors, and evaluate the effects of overheating, due to reliable dynamic over-clocking mechanisms, on the lifetime reliability of such systems. We, then, evaluate the effects of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably over-clocked system, along with dynamic thermal throttling, achieves around 25% performance improvement, while operating within 355 K.</p>
dc.description.comments <p>This is a manuscript of a proceeding published as Subramanian, Viswanathan, Prem Kumar Ramesh, and Arun K. Somani. "Managing the impact of on-chip temperature on the lifetime reliability of reliably overclocked systems." In <em>2009 Second International Conference on Dependability</em> (2009): DOI: <a href="https://doi.org/10.1109/DEPEND.2009.30" target="_blank">10.1109/DEPEND.2009.30</a>. Posted with permission.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/ece_conf/128/
dc.identifier.articleid 1128
dc.identifier.contextkey 21688355
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath ece_conf/128
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/93917
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/ece_conf/128/2009_SomaniArun_ManagingImpact.pdf|||Fri Jan 14 19:30:30 UTC 2022
dc.source.uri 10.1109/DEPEND.2009.30
dc.subject.disciplines Digital Communications and Networking
dc.subject.disciplines Systems and Communications
dc.subject.keywords Dependable and Adaptive Systems
dc.subject.keywords Overclocking
dc.subject.keywords Thermal Management
dc.title Managing the Impact of On-chip Temperature on the Lifetime Reliability of Reliably Overclocked Systems
dc.type article
dc.type.genre conference
dspace.entity.type Publication
relation.isAuthorOfPublication edede50a-4e31-44f3-a7c7-a06dc8db42c2
relation.isOrgUnitOfPublication a75a044c-d11e-44cd-af4f-dab1d83339ff
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