Development programs for one-shot systems using multiple-state design reliability models
Date
Authors
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Design reliability at the beginning of a product development program is typically low, and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change.
Series Number
Journal Issue
Is Version Of
Versions
Series
Academic or Administrative Unit
Type
Comments
This is the peer reviewed version of the following article: Development programs for one-shot systems using multiple-state design reliability models. Naval Research Logistics, 2004, Vol. 51, No. 6, pp. 873-892. With Suntichai Shevasuthisilp, which has been published in final form at http://dx.doi.org/10.1002/nav.20033. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving.