Electronic holography and shearography NDE for inspection of modern materials and structures

dc.contributor.author Clarady, J.
dc.contributor.author Summers, M.
dc.date 2018-02-14T02:55:08.000
dc.date.accessioned 2020-06-30T06:41:38Z
dc.date.available 2020-06-30T06:41:38Z
dc.date.copyright Fri Jan 01 00:00:00 UTC 1993
dc.date.issued 1993
dc.description.abstract <p>Coherent optical techniques such as holography, shearography, and ESPI have been available for inspection applications for years. However, they are still not well known or widely used. In fact, they have sometimes been described as “a solution looking for a problem” and like so many new technologies, they may have been somewhat oversold. These optical NDE methods do, however, offer some impressive advantages over more conventional inspection techniques for the right applications. It is the intent of this paper to provide some basic information on how two of these optical methods, holography and shearography, work discuss capabilities and limitations of both, present the electronic holography and shearography inspection system developed by UTRC/Pratt & Whitney, and provide some examples of successful applications of both.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1993/allcontent/49/
dc.identifier.articleid 1286
dc.identifier.contextkey 5774060
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1993/allcontent/49
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/60292
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1993/allcontent/49/1993_Clarady_ElectronicHolography.pdf|||Sat Jan 15 00:29:08 UTC 2022
dc.source.uri 10.1007/978-1-4615-2848-7_49
dc.subject.disciplines Atomic, Molecular and Optical Physics
dc.subject.disciplines Optics
dc.subject.disciplines Semiconductor and Optical Materials
dc.subject.disciplines Structures and Materials
dc.title Electronic holography and shearography NDE for inspection of modern materials and structures
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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