Using Accelerated Life Tests Results to Predict Product Field Reliability

dc.contributor.author Meeker, William
dc.contributor.author Escobar, Luis
dc.contributor.author Meeker, William
dc.contributor.author Hong, Yili
dc.contributor.department Statistics
dc.date 2018-02-16T20:47:15.000
dc.date.accessioned 2020-07-02T06:56:19Z
dc.date.available 2020-07-02T06:56:19Z
dc.date.issued 2008-06-01
dc.description.abstract <p>Accelerated life tests (ALTs) provide timely assessments of the reliability of materials, components, and subsystems. ALTs can be run at any of these levels or at the full-system level. Sometimes ALTs generate multiple failure modes. A frequently asked question, coming near to the end of an ALT program, is “What do these test results say about field performance?” ALTs are carefully controlled whereas the field environment is highly variable. Products in the field see, for example, different average use rates across the product population. With good characterization of field use conditions, it may be possible to use ALT results to predict the failure time distribution in the field. When such information is not available but both life test data and field data (e.g., from warranty returns) are available, it may be possible to find a model to relate the two data sets. Under a reasonable set of practical assumptions, this model can then be used to predict the failure time distribution for a future component or product operating in the same use environment. This paper describes a model and methods for such situations. The methods will be illustrated by an example to predict the failure time distribution of a newly designed product with two failure modes.</p>
dc.description.comments <p>This preprint was published as William Q. Meeker, Luis A. Escobar and Yili Hong, " Using Accelerated Life Tests Results to Predict Product Field Reliability", <em>Technometrics</em> (2009): 146-161, doi: <a href="http://dx.doi.org/10.1198/TECH.2009.0016" target="_blank">10.1198/TECH.2009.0016</a>.</p>
dc.identifier archive/lib.dr.iastate.edu/stat_las_preprints/64/
dc.identifier.articleid 1061
dc.identifier.contextkey 7413135
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath stat_las_preprints/64
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/90359
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/stat_las_preprints/64/2008_MeekerWQ_UsingAcceleratedLife.pdf|||Sat Jan 15 01:21:47 UTC 2022
dc.subject.disciplines Statistics and Probability
dc.subject.keywords Center for Nondestructive Evaluation
dc.subject.keywords bivariate lognormal distribution
dc.subject.keywords censored data
dc.subject.keywords competing risks
dc.subject.keywords fatigue
dc.subject.keywords maximum likelihood
dc.subject.keywords multiple failure modes
dc.subject.keywords reliability
dc.subject.keywords warranty
dc.title Using Accelerated Life Tests Results to Predict Product Field Reliability
dc.type article
dc.type.genre article
dspace.entity.type Publication
relation.isAuthorOfPublication a1ae45d5-fca5-4709-bed9-3dd8efdba54e
relation.isOrgUnitOfPublication 264904d9-9e66-4169-8e11-034e537ddbca
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