Defect Characterization-Fundamental Flaw Classification Solution Potential

Thumbnail Image
Date
1977-09-01
Authors
Rose, Joseph
Eisenstein, Bruce
Fehlauer, John
Avioli, Michael
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Authors
Research Projects
Organizational Units
Journal Issue
Is Version Of
Versions
Series
Department
Abstract

Pattern recognition techniques are currently being applied to many signal interpretation problems in nondestructive testing. Simulearning technology combines various aspects of wave propagation analysis, pattern recognition philosophy, and signal processing theory in such a way as to outline procedures and establish guidelines for solving many problems in flaw classification. A portion of this paper will be used to present flaw classification problem statements and potential solution techniques along with simple data and analysis techniques.

Comments
Description
Keywords
Citation
DOI
Source
Copyright
Sat Jan 01 00:00:00 UTC 1977
Collections