Defect Characterization-Fundamental Flaw Classification Solution Potential

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Date
1977-09-01
Authors
Rose, Joseph
Eisenstein, Bruce
Fehlauer, John
Avioli, Michael
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Abstract

Pattern recognition techniques are currently being applied to many signal interpretation problems in nondestructive testing. Simulearning technology combines various aspects of wave propagation analysis, pattern recognition philosophy, and signal processing theory in such a way as to outline procedures and establish guidelines for solving many problems in flaw classification. A portion of this paper will be used to present flaw classification problem statements and potential solution techniques along with simple data and analysis techniques.

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Interdisciplinary Program for Quantitative Flaw Definition Annual Reports
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report
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Sat Jan 01 00:00:00 UTC 1977
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