Nondestructive Detection of Voids by a High Frequency Technique
Date
1979
Authors
Cohen, Jack
Bleistein, Norman
Elsley, Richard
Major Professor
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Abstract
A direct solution of the ultrasonic inverse scattering problem, known by the acronym POFFIS, which stands for Physical Optics Far Field lnverse Scattering, has been developed. This technique has been used to reconstruct the shape and size of both simulated and real void flaws in materials.
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Is Version Of
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Series
Interdisciplinary Program for Quantitative Flaw Definition Annual Reports
Academic or Administrative Unit
Type
report
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Copyright
Mon Jan 01 00:00:00 UTC 1979