Nondestructive Detection of Voids by a High Frequency Technique

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1979
Authors
Cohen, Jack
Bleistein, Norman
Elsley, Richard
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Abstract

A direct solution of the ultrasonic inverse scattering problem, known by the acronym POFFIS, which stands for Physical Optics Far Field lnverse Scattering, has been developed. This technique has been used to reconstruct the shape and size of both simulated and real void flaws in materials.

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Mon Jan 01 00:00:00 UTC 1979
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