Analysis of Scanning Acoustic Microscopy Images of IC Chips
| dc.contributor.author | Khan, J. | |
| dc.contributor.author | Mina, Mani | |
| dc.contributor.author | Udpa, L. | |
| dc.contributor.author | Udpa, S. | |
| dc.date | 2018-02-14T05:07:21.000 | |
| dc.date.accessioned | 2020-06-30T06:42:09Z | |
| dc.date.available | 2020-06-30T06:42:09Z | |
| dc.date.copyright | Sun Jan 01 00:00:00 UTC 1995 | |
| dc.date.issued | 1995 | |
| dc.description.abstract | <p>The detection, isolation, and characterization of flaws in components represent a critical need in manufacturing and quality control. Nondestructive testing (NDT) provides an effective way of inspecting materials for ensuring the quality and integrity of products and systems. Consequently, nondestructive inspection finds extensive application in several industries such as steel, nuclear and electronic industries for the evaluation of complex test objects with minimal interruption of routine operations[1].</p> | |
| dc.format.mimetype | application/pdf | |
| dc.identifier | archive/lib.dr.iastate.edu/qnde/1995/allcontent/115/ | |
| dc.identifier.articleid | 2137 | |
| dc.identifier.contextkey | 5789468 | |
| dc.identifier.s3bucket | isulib-bepress-aws-west | |
| dc.identifier.submissionpath | qnde/1995/allcontent/115 | |
| dc.identifier.uri | https://dr.lib.iastate.edu/handle/20.500.12876/60366 | |
| dc.language.iso | en | |
| dc.relation.ispartofseries | Review of Progress in Quantitative Nondestructive Evaluation | |
| dc.source.bitstream | archive/lib.dr.iastate.edu/qnde/1995/allcontent/115/1995_Khan_AnalysisScanning.pdf|||Fri Jan 14 18:51:23 UTC 2022 | |
| dc.source.uri | 10.1007/978-1-4615-1987-4_115 | |
| dc.subject.disciplines | Signal Processing | |
| dc.subject.keywords | Electrical and Computer Engineering | |
| dc.title | Analysis of Scanning Acoustic Microscopy Images of IC Chips | |
| dc.type | event | |
| dc.type.genre | article | |
| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | 67ebca67-8fe0-45a7-ba89-f52eaef49ab1 | |
| relation.isSeriesOfPublication | 289a28b5-887e-4ddb-8c51-a88d07ebc3f3 |
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