Low Frequency Characterization of Flaws in Ceramics

dc.contributor.author Elsley, Richard
dc.contributor.author Ahlberg, L.
dc.contributor.author Richardson, John
dc.date 2018-02-13T18:25:50.000
dc.date.accessioned 2020-06-30T01:29:09Z
dc.date.available 2020-06-30T01:29:09Z
dc.date.copyright Thu Jan 01 00:00:00 UTC 1981
dc.date.embargo 2013-12-03
dc.date.issued 1981-09-01
dc.description.abstract <p>There is an increasing need for the characterization of small flaws in ceramic components. This project is concerned with detecting and characterizing flaws in the bulk of ceramic parts. Cylindrical tensile test specimens of hot pressed Si<sub>3</sub>N<sub>4</sub> are being prepared and, when available, will be inspected. In preparation for the arrival of the samples, measurement techniques have been developed for inspection of cylindrical shaped samples, signal processing techniques have been developed for obtaining flaw scattering data over a broad range of frequencies and analysis techniques have been developed to automatically extract flaw characteristics from measured data.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/cnde_yellowjackets_1981/26/
dc.identifier.articleid 1026
dc.identifier.contextkey 4871908
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath cnde_yellowjackets_1981/26
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/16163
dc.language.iso en
dc.relation.ispartofseries Interdisciplinary Program for Quantitative Flaw Definition Annual Reports
dc.source.bitstream archive/lib.dr.iastate.edu/cnde_yellowjackets_1981/26/1981_YellowJacket_026_Elsley_LowFrequency.pdf|||Fri Jan 14 23:00:15 UTC 2022
dc.subject.disciplines Materials Science and Engineering
dc.subject.keywords Nondestructive Evaluation
dc.title Low Frequency Characterization of Flaws in Ceramics
dc.type report
dc.type.genre report
dspace.entity.type Publication
relation.isSeriesOfPublication 43920e40-d127-4f4c-9087-dc709815fe7f
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