Diffraction paradox: An unusually broad diffraction background marks high quality graphene

dc.contributor.author Chen, Shen
dc.contributor.author Horn-von Hoegen, Michael
dc.contributor.author Thiel, Patricia
dc.contributor.author Tringides, Michael
dc.contributor.department Ames National Laboratory
dc.contributor.department Physics and Astronomy
dc.contributor.department Materials Science and Engineering
dc.contributor.department Chemistry
dc.contributor.department Ames Laboratory
dc.date 2019-10-23T18:08:57.000
dc.date.accessioned 2020-06-30T01:16:55Z
dc.date.available 2020-06-30T01:16:55Z
dc.date.copyright Tue Jan 01 00:00:00 UTC 2019
dc.date.issued 2019-10-15
dc.description.abstract <p>The realization of the unusual properties of two-dimensional (2D) materials requires the formation of large domains of single-layer thickness, extending over the mesoscale. It is found that the formation of uniform graphene on SiC, contrary to textbook diffraction, is signaled by a strong bell-shaped component (BSC) around the (00) and G(10) spots (but not around the substrate spots). The BCS is also seen on graphene grown on metals, because a single uniform graphene layer can be also grown with large lateral size. It is only seen by electron diffraction but not with x-ray or He scattering. Although the origin of such an intriguing result is unclear, its presence in the earlier literature (but never mentioned) points to its robustness and significance. A likely mechanism relates to the the spatial confinement of the graphene electrons, within a single layer. This leads to large spread in their wave vector which is transferred by electron-electron interactions to the elastically scattered electrons to generate the BSC.</p>
dc.description.comments <p>This article is published as Chen, S., M. Horn von Hoegen, P. A. Thiel, and M. C. Tringides. "Diffraction paradox: An unusually broad diffraction background marks high quality graphene." <em>Physical Review B </em>100, no. 15 (2019): 155307. DOI: <a href="http://dx.doi.org/10.1103/PhysRevB.100.155307" target="_blank">10.1103/PhysRevB.100.155307</a>. Posted with permission.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/chem_pubs/1139/
dc.identifier.articleid 2142
dc.identifier.contextkey 15163814
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath chem_pubs/1139
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/14444
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/chem_pubs/1139/2019_ThielPatricia_DiffractionParadox.pdf|||Fri Jan 14 18:48:51 UTC 2022
dc.source.uri 10.1103/PhysRevB.100.155307
dc.subject.disciplines Condensed Matter Physics
dc.subject.disciplines Materials Chemistry
dc.title Diffraction paradox: An unusually broad diffraction background marks high quality graphene
dc.type article
dc.type.genre article
dspace.entity.type Publication
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