The need for in-process characterization of metallic components is being recognized increasingly. In the field of x-ray analysis the x-ray fluorescent (spectroscopy) techniques have been successfully applied to in-process inspection, while successes in x-ray diffraction have been sparse. X-ray diffraction characterization techniques should be fast, non-contacting, and tolerant of detector to component distance variation. The Ruud-Barrett position-sensitive scintillation detector (R-B PSSD) is unique in its ability to satisfy these requirements, and has been successful in measuring plastic deformation, residual stress and crystalline texture in FCC metal alloys.