Plastic Deformation, Residual Stress, and Crystalline Texture Measurements for In-Process Characterization of FCC Metal Alloys

dc.contributor.author Ruud, C.
dc.contributor.author Snoha, D.
dc.contributor.author Jacobs, M.
dc.contributor.author Weedman, S.
dc.date 2018-02-14T05:45:27.000
dc.date.accessioned 2020-06-30T06:34:52Z
dc.date.available 2020-06-30T06:34:52Z
dc.date.copyright Sun Jan 01 00:00:00 UTC 1989
dc.date.issued 1989
dc.description.abstract <p>The need for in-process characterization of metallic components is being recognized increasingly. In the field of x-ray analysis the x-ray fluorescent (spectroscopy) techniques have been successfully applied to in-process inspection, while successes in x-ray diffraction have been sparse. X-ray diffraction characterization techniques should be fast, non-contacting, and tolerant of detector to component distance variation. The Ruud-Barrett position-sensitive scintillation detector (R-B PSSD) is unique in its ability to satisfy these requirements, and has been successful in measuring plastic deformation, residual stress and crystalline texture in FCC metal alloys.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1989/allcontent/227/
dc.identifier.articleid 2453
dc.identifier.contextkey 5799569
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1989/allcontent/227
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59328
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1989/allcontent/227/1989_Ruud_PlasticDeformation.pdf|||Fri Jan 14 22:44:11 UTC 2022
dc.source.uri 10.1007/978-1-4613-0817-1_227
dc.title Plastic Deformation, Residual Stress, and Crystalline Texture Measurements for In-Process Characterization of FCC Metal Alloys
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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