Electromagnetic Microscope Compared to a Conventional Probe

Date
1999
Authors
Podney, Walter
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Altmetrics
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The paper compares performance of conventional, pulsed, eddy current technology [1] to performance of superconductive technology [2], for identifying cracks at rivet holes in a multilayer joint. It compares area of the smallest crack detectable by a conventional, reflection type probe with that detectable by a superconductive, reflection type probe. The smallest crack detectable depends on noise resolution and radius of the pickup loop. A superconductive probe presently can detect a crack at a rivet hole that is two to three times smaller than the smallest crack detectable by a conventional probe.

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