Electromagnetic Microscope Compared to a Conventional Probe
The paper compares performance of conventional, pulsed, eddy current technology  to performance of superconductive technology , for identifying cracks at rivet holes in a multilayer joint. It compares area of the smallest crack detectable by a conventional, reflection type probe with that detectable by a superconductive, reflection type probe. The smallest crack detectable depends on noise resolution and radius of the pickup loop. A superconductive probe presently can detect a crack at a rivet hole that is two to three times smaller than the smallest crack detectable by a conventional probe.