Electromagnetic Microscope Compared to a Conventional Probe
| dc.contributor.author | Podney, Walter | |
| dc.date | 2018-02-14T09:01:10.000 | |
| dc.date.accessioned | 2020-06-30T06:50:42Z | |
| dc.date.available | 2020-06-30T06:50:42Z | |
| dc.date.copyright | Fri Jan 01 00:00:00 UTC 1999 | |
| dc.date.issued | 1999 | |
| dc.description.abstract | <p>The paper compares performance of conventional, pulsed, eddy current technology [1] to performance of superconductive technology [2], for identifying cracks at rivet holes in a multilayer joint. It compares area of the smallest crack detectable by a conventional, reflection type probe with that detectable by a superconductive, reflection type probe. The smallest crack detectable depends on noise resolution and radius of the pickup loop. A superconductive probe presently can detect a crack at a rivet hole that is two to three times smaller than the smallest crack detectable by a conventional probe.</p> | |
| dc.format.mimetype | application/pdf | |
| dc.identifier | archive/lib.dr.iastate.edu/qnde/1999/allcontent/151/ | |
| dc.identifier.articleid | 4014 | |
| dc.identifier.contextkey | 5820262 | |
| dc.identifier.s3bucket | isulib-bepress-aws-west | |
| dc.identifier.submissionpath | qnde/1999/allcontent/151 | |
| dc.identifier.uri | https://dr.lib.iastate.edu/handle/20.500.12876/61579 | |
| dc.language.iso | en | |
| dc.relation.ispartofseries | Review of Progress in Quantitative Nondestructive Evaluation | |
| dc.source.uri | 10.1007/978-1-4615-4791-4_151 | |
| dc.title | Electromagnetic Microscope Compared to a Conventional Probe | |
| dc.type | event | |
| dc.type.genre | article | |
| dspace.entity.type | Publication | |
| relation.isSeriesOfPublication | 289a28b5-887e-4ddb-8c51-a88d07ebc3f3 |