Sub-Bandgap Laser Probing of GaAs Devices and Circuits

Date
1988
Authors
Mechtel, D.
Andreou, A.
Christodoulides, D.
Wagner, J.
Westgate, C.
Palmer, C.
Poehler, T.
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Altmetrics
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Abstract

Standard methods for measuring solid-state device and circuit performance are inadequate at GHz speeds because they introduce parasitic inductances and capacitances that change circuit operation and characteristics. One promising noninvasive procedure that avoids these problems uses electro-optic probing to yield information on device packaging techniques; and on device and circuit performance characteristics such as voltage waveforms, timing, and propagation delays in both analog and digital circuits.

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