Detection of Coating Adhesion Defects Using Fast Infrared Scanning Technique

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1990
Authors
hartikainen, Jari
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Altmetrics
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In the past ten years a variety of thermal wave nondestructive measurement systems have been developed but most of them are too slow, fragile or expensive in order to be applied in industry. The standard approach to increase the measurement speed has been to apply a uniform heat pulse and to monitor c he surface temperature with an infrared camera [1]. However, in many practical situations the full speed of an infrared camera is not really needed and thus a moving line source can be used for heating and the surface temperature rise can be detected with a one dimensional infrared scanner without a significant increase in inspection time. This approach has several benefits including:

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