Uniform Eddy Current Probe with Little Disrupting Noise
Date
1998
Authors
Hoshikawa, Hiroshi
Koyama, Kiyoshi
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Abstract
The conventional eddy current testing using a pancake coil probe is prone to suffer from various noises generated by variations of many factors such as probe lift-off, material electromagnetic characteristics and material configurations. Thus it is very difficult for the conventional eddy current testing to detect flaws in variable areas such as weld zone and material edge. In order to detect those flaws, it is indispensable to develop new eddy current probes with little disrupting noise[l–3].
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Thu Jan 01 00:00:00 UTC 1998