Uniform Eddy Current Probe with Little Disrupting Noise

dc.contributor.author Hoshikawa, Hiroshi
dc.contributor.author Koyama, Kiyoshi
dc.date 2018-02-14T08:21:53.000
dc.date.accessioned 2020-06-30T06:48:41Z
dc.date.available 2020-06-30T06:48:41Z
dc.date.copyright Thu Jan 01 00:00:00 UTC 1998
dc.date.issued 1998
dc.description.abstract <p>The conventional eddy current testing using a pancake coil probe is prone to suffer from various noises generated by variations of many factors such as probe lift-off, material electromagnetic characteristics and material configurations. Thus it is very difficult for the conventional eddy current testing to detect flaws in variable areas such as weld zone and material edge. In order to detect those flaws, it is indispensable to develop new eddy current probes with little disrupting noise[l–3].</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1998/allcontent/137/
dc.identifier.articleid 3729
dc.identifier.contextkey 5810523
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1998/allcontent/137
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/61292
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1998/allcontent/137/1998_Hoshikawa_UniformEddy.pdf|||Fri Jan 14 19:58:45 UTC 2022
dc.source.uri 10.1007/978-1-4615-5339-7_137
dc.subject.disciplines Electromagnetics and Photonics
dc.title Uniform Eddy Current Probe with Little Disrupting Noise
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
Original bundle
Now showing 1 - 1 of 1
944.65 KB
Adobe Portable Document Format