Correlation of Thin-Film Bond Compliance and Bond Fracture Resistance

dc.contributor.author Addison, R.
dc.contributor.author Marshall, D.
dc.date 2018-02-14T04:08:53.000
dc.date.accessioned 2020-06-30T06:33:22Z
dc.date.available 2020-06-30T06:33:22Z
dc.date.copyright Fri Jan 01 00:00:00 UTC 1988
dc.date.issued 1988
dc.description.abstract <p>The integrity of the interfacial bond between a coating and its substrate is of primary importance for any application. A technique for the quantitative nondestructive measurement of the bond fracture energy is essential for evaluating bond integrity. Scanning acoustic microscopy (SAM) provides a method for making localized measurements of film dis-bonds and film bond compliance based on the changes in the surface acoustic wave velocity in the layered medium. The results of these measurements for chrome/gold and gold films on glass substrates are summarized. The compliance of the bond and its fracture energy can be correlated in some film systems. An experiment to determine if this correlation exists for chrome/gold and gold films on sapphire substrates is described. Results of such an experiment would provide an empirical correlation between surface acoustic wave velocity measurements and the fracture energy of the film. The results of an experiment to measure the fracture energy of the interfacial bond between a gold film and the sapphire substrate are described.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1988/allcontent/37/
dc.identifier.articleid 1648
dc.identifier.contextkey 5783439
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1988/allcontent/37
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59117
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1988/allcontent/37/1988_Addison_Correlation.pdf|||Fri Jan 14 23:49:03 UTC 2022
dc.source.uri 10.1007/978-1-4613-0979-6_37
dc.subject.disciplines Electronic Devices and Semiconductor Manufacturing
dc.title Correlation of Thin-Film Bond Compliance and Bond Fracture Resistance
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
File
Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
1988_Addison_Correlation.pdf
Size:
1.14 MB
Format:
Adobe Portable Document Format
Description: