Scanning Differential Contrast Microscopy

dc.contributor.author	Kino, G.
dc.contributor.author	Chou, C.-H.
dc.contributor.author	Corle, T.
dc.contributor.author	Hobbs, P.
dc.date	2018-02-14T03:11:55.000
dc.date.accessioned	2020-06-30T06:31:56Z
dc.date.available	2020-06-30T06:31:56Z
dc.date.copyright	Sat Aug 01 00:00:00 UTC 1987
dc.date.issued	1987
dc.description.abstract	<p>We have been carrying out research on two types of scanning optical microscopes with the aim of measuring not only the width of surface features, but also the thickness of thin films and surface profiles.</p>
dc.format.mimetype	application/pdf
dc.identifier	archive/lib.dr.iastate.edu/qnde/1987/allcontent/149/
dc.identifier.articleid	1418
dc.identifier.contextkey	5774307
dc.identifier.s3bucket	isulib-bepress-aws-west
dc.identifier.submissionpath	qnde/1987/allcontent/149
dc.identifier.uri	https://dr.lib.iastate.edu/handle/20.500.12876/58924
dc.language.iso	en
dc.relation.ispartofseries	Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream	archive/lib.dr.iastate.edu/qnde/1987/allcontent/149/1987_Kino_ScanningDifferential.pdf\|\|\|Fri Jan 14 20:28:12 UTC 2022
dc.source.uri	10.1007/978-1-4613-1893-4_149
dc.subject.disciplines	Electrical and Electronics
dc.subject.disciplines	Semiconductor and Optical Materials
dc.title	Scanning Differential Contrast Microscopy
dc.type	event
dc.type.genre	article
dspace.entity.type	Publication
relation.isSeriesOfPublication	289a28b5-887e-4ddb-8c51-a88d07ebc3f3

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