Quantitative analysis of a class of subsurface cracks using shearography and finite element modeling

dc.contributor.author Melvin, Leland
dc.contributor.author Childers, Brooks
dc.contributor.author Fulton, James
dc.date 2018-02-14T02:55:31.000
dc.date.accessioned 2020-06-30T06:41:40Z
dc.date.available 2020-06-30T06:41:40Z
dc.date.copyright Fri Jan 01 00:00:00 UTC 1993
dc.date.issued 1993
dc.description.abstract <p>The application of a full field non-contacting measurement system for nondestructively evaluating (NDE) subsurface flaws in structures has been conducted using Electronic Shearography. Shearography has primarily been used as a qualitative tool for locating areas of stress concentration caused by anomalies in materials[1–4]. NASA has been applying optical techniques such as these to NDE inspection of aircraft lap joint integrity, composite material defects, and pressure vessel quality assurance. This paper examines a special class of defects manufactured in thin metal panels and serves as a testbed for interpreting the displacement gradients produced on a simple well-characterized sample with known defects. Electrode discharge machining (EDM) notches were cut into panels to simulate subsurface cracks. Shearography was used to determine the detectability of subsurface cracks ranging in size from 0.8 mm to 25.4 mm fabricated in both steel and aluminum test panels. Finite element modeling was used to verify and quantify experimental results obtained in these tests. Very good agreement existed between both the experimental and predicted displacement models.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1993/allcontent/52/
dc.identifier.articleid 1289
dc.identifier.contextkey 5774063
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1993/allcontent/52
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/60296
dc.language.iso en
dc.relation.ispartofseries Review of Progress in Quantitative Nondestructive Evaluation
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1993/allcontent/52/1993_Melvin_QuantitativeAnalysis.pdf|||Sat Jan 15 00:46:15 UTC 2022
dc.source.uri 10.1007/978-1-4615-2848-7_52
dc.subject.disciplines Atomic, Molecular and Optical Physics
dc.subject.disciplines Optics
dc.subject.disciplines Semiconductor and Optical Materials
dc.subject.disciplines Structures and Materials
dc.title Quantitative analysis of a class of subsurface cracks using shearography and finite element modeling
dc.type event
dc.type.genre article
dspace.entity.type Publication
relation.isSeriesOfPublication 289a28b5-887e-4ddb-8c51-a88d07ebc3f3
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