A Laplace Transform Based Inverse Method for Flaw Characterization by Eddy Currents

dc.contributor.author Nair, Satish
dc.contributor.author Rose, James
dc.date 2018-02-14T04:40:57.000
dc.date.accessioned 2020-06-30T06:35:25Z
dc.date.available 2020-06-30T06:35:25Z
dc.date.copyright Sun Jan 01 00:00:00 UTC 1989
dc.date.issued 1989
dc.description.abstract <p>Eddy current probes have been widely and successfully used to detect surface breaking flaws in metals. It is quite natural to ask if the eddy current signal can be used to characterize the flaw, i.e. determine its type, length or depth? This paper is a “report in progress” on just this question. The basic strategy is to find an eddy-current flaw characterization problem simple enough that an analytic solution is possible. This analytic solution is then used to uncover the elements generic to eddy-current characterization (inversion) methods.</p>
dc.format.mimetype application/pdf
dc.identifier archive/lib.dr.iastate.edu/qnde/1989/allcontent/40/
dc.identifier.articleid 1916
dc.identifier.contextkey 5783893
dc.identifier.s3bucket isulib-bepress-aws-west
dc.identifier.submissionpath qnde/1989/allcontent/40
dc.identifier.uri https://dr.lib.iastate.edu/handle/20.500.12876/59409
dc.language.iso en
dc.source.bitstream archive/lib.dr.iastate.edu/qnde/1989/allcontent/40/1989_Nair_LaplaceTransform.pdf|||Sat Jan 15 00:06:54 UTC 2022
dc.source.uri 10.1007/978-1-4613-0817-1_40
dc.subject.disciplines Electromagnetics and Photonics
dc.subject.keywords CNDE
dc.title A Laplace Transform Based Inverse Method for Flaw Characterization by Eddy Currents
dc.type event
dc.type.genre article
dspace.entity.type Publication
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