Direct Determination of Sizes of Excitations from Optical Measurements on Ion-Implanted GaAs

Thumbnail Image
Date
1982-06-01
Authors
Aspnes, D. E.
Kelso, S. M.
Olson, C. G.
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Research Projects
Journal Issue
Series
Abstract

Using a simple model that describes the decrease of the amplitudes of optical structures in ion-implanted crystals, projected areas of several valence and core excitons in GaAs are determined. The last remnant of crystal-related optical structure vanishes for crystallite areas less than (16Å)2.

Comments

This article is from Physical Review Letters 48 (1982): 1863, doi:10.1103/PhysRevLett.48.1863. Posted with permission.

Description
Keywords
Citation
DOI
Copyright
Fri Jan 01 00:00:00 UTC 1982
Collections